AI-powered yield analysis, real-time drift alerts, and DOE optimization for semiconductor manufacturing excellence.
Unify yield analytics, drift detection, and optimization in one intelligent platform
Advanced statistical analysis with ML-powered pattern recognition across wafer maps, bin distributions, and parametric data.
Proactive process drift detection with customizable thresholds and automated notifications to prevent yield excursions.
Intelligent Design of Experiments with automated parameter tuning, response surface modeling, and optimal recipe generation.
Real-time yield monitoring across production lines with instant anomaly detection and root cause analysis.
Accelerate process development with intelligent DOE workflows and automated parameter optimization.
Statistical process control with advanced trending, control charts, and deviation investigation tools.
Comprehensive yield loss analysis with Pareto prioritization and continuous improvement tracking.
Our proprietary ML algorithms learn from your manufacturing data to provide predictive insights, automated root cause analysis, and optimization recommendations.
Neural networks trained on billions of wafer test results
Sub-second analysis of incoming manufacturing data
SOC 2 Type II compliant with end-to-end encryption
ChipYield.tech was founded by semiconductor industry veterans and AI researchers who recognized the gap between traditional yield management tools and modern manufacturing needs.
Our mission is to democratize advanced yield analytics, making enterprise-grade intelligence accessible to fabs of all sizes. We combine decades of domain expertise with cutting-edge machine learning to deliver actionable insights that drive measurable improvements.
Schedule a personalized demo to see how ChipYield.tech can optimize your manufacturing process.